4.3.2 Performance tests (Refer to R 60-2, 2.10)
For details, refer to the tests as indicated in the last column.
Tests performed at ( / / / ):
Test procedure | Passed | Failed | Details in R 60 |
|---|---|---|---|
Maximum permissible measurement errors | R 60-1, 5.3 / R 60-2, 2.10.1 | ||
Repeatability error | R 60-1, 5.4 / R 60-2, 2.10.1 | ||
Temperature effect on minimum dead load output return | R 60-1, 5.6.1.3 / R 60-2, 2.10.1 | ||
Creep test | R 60-1, 5.5.1 / R 60-2, 2.10.2 | ||
Minimum dead load output return (DR) | R 60-1, 5.5.2 / R 60-2, 2.10.3 | ||
Barometric pressure effects at ambient temperature | R 60-1, 5.6.2 / R 60-2, 2.10.4 | ||
Humidity effects (CH, SH) | R 60-1, 5.6.3 / R 60-2, 2.10.5 / 2.10.6 |
Additional tests performed for digital load cells:
Test procedure | Passed | Failed | Details in R 60 |
|---|---|---|---|
Warm-up time | R 60-1, 5.7.2.1 / R 60-2, 2.10.7.3 | ||
Power voltage variations | R 60-1, 5.7.2.2 / 5.7.2.3 / 5.7.2.4 / R 60-2, 2.10.7.4 | ||
Short-time power reductions | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.5 | ||
Bursts (electrical fast transients) | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.6 | ||
Surge | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.7 | ||
Electrostatic discharge | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.8 | ||
Electromagnetic susceptibility | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.9 | ||
Immunity to conducted electromagnetic fields | R 60-1, 5.7.2.5 / R 60-2, 2.10.7.10 | ||
Span stability | R 60-1, 5.7.2.6 / R 60-2, 2.10.7.11 | ||
Software | R 60-1, 6.1 |